The automatic test pattern generation device of the sequential circuit automatic test pattern generation system

摘要

PROBLEM TO BE SOLVED: To allow reusing a test pattern and a test sequence already generated when a sequence circuit having the already generated test pattern, is changed.;SOLUTION: A sequence circuit automatic test pattern generation system is provided with an automatic test pattern generation apparatus of the sequence circuit, a database for recording the test pattern generated by the automatic test pattern generation apparatus, a failure table and a net list, an index creation means for creating an index for respectively associating the test pattern for each failure recorded in the database with each circuit block of the net list, a database search means for retrieving the database by using the index and a database control means for partially obtaining the already generated test pattern from the data base by using the database retrieving means and generating a new test pattern by using the automatic test pattern generation apparatus when the sequence circuit is partially changed.;COPYRIGHT: (C)2004,JPO