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Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe)

机译:使用多光束低相干光学探头(Quad-Probe)的自由形式光学计量学的进展

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摘要

Conformal windows reduce drag, but introduce optical aberrations. Corrector optics minimize such optical aberrations, but they feature complex surfaces that cannot presently be measured interferometrically. To address this problem, ASE Optics has developed a non-contact "Quad-Probe" that measure the position and orientation of surfaces. By scanning the probe over the surface of the optic, a 3D model of the interior and exterior surfaces can be built. Furthermore, the Quad-Probe can be used inside a polishing machine, and feedback from the Quad-Probe can be used to guide the scanner in measuring an unknown part.
机译:保形窗口可减少阻力,但会引入光学像差。校正光学器件可将此类光学像差降至最低,但它们具有复杂的表面,目前无法通过干涉测量法进行测量。为了解决这个问题,ASE Optics开发了一种非接触式“ Quad-Probe”,用于测量表面的位置和方向。通过在光学器件的表面上扫描探针,可以构建内部和外部表面的3D模型。此外,Quad-Probe可在抛光机内部使用,Quad-Probe的反馈可用于指导扫描仪测量未知零件。

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