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Advances in freeform optical metrology using a multibeam low-coherence optical probe (Quad-Probe)

机译:使用多滨低相干光学探针(四探针)的自由形态光学计量进展

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Conformal windows reduce drag, but introduce optical aberrations. Corrector optics minimize such optical aberrations, but they feature complex surfaces that cannot presently be measured interferometrically. To address this problem, ASE Optics has developed a non-contact "Quad-Probe" that measure the position and orientation of surfaces. By scanning the probe over the surface of the optic, a 3D model of the interior and exterior surfaces can be built. Furthermore, the Quad-Probe can be used inside a polishing machine, and feedback from the Quad-Probe can be used to guide the scanner in measuring an unknown part.
机译:保形窗口减少拖动,但引入光学像差。校正光学器件最小化这种光学像差,但它们具有复杂的表面,其不能呈现出呈现出的干涉。为了解决这个问题,ASE Optics开发了一种非联系人“Quad-Probe”,可以测量表面的位置和方向。通过在光学表面上扫描探针,可以构建内部和外表面的3D模型。此外,可以在抛光机内使用四探针,并且可以使用来自四探针的反馈来指导扫描仪测量未知部分。

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