Determination of third-order aberration coefficients from spherical aberration measurement

摘要

The imaging quality of an optical system depends on the magnitude of residual aberrations of the optical system. Aberrations of optical systems can be analytically expressed as a sum of aberrations of different orders. The most important for practice are the third-order aberrations (Seidel aberrations) and the fifth-order aberrations. Our work shows one of possible methods for determination of third-order aberration coefficients that is based on measurement of spherical aberration of the investigated optical system. The advantage of this method for determination of the third-order aberration coefficients is the fact that the measurement of spherical aberration can be experimentally relatively easily performed with a sufficient accuracy. This work presents a detailed theoretical analysis of the proposed method and relations for calculation of the third-order aberration coefficients.