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Green Photoluminescence from Al2O3:Tb films by Medium Frequency Reactive Magnetron Sputtering

机译:中频反应磁控溅射Al2O3:Tb薄膜的绿色光致发光

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Terbium-doped aluminum oxide films (Al2O3 :Tb) were deposited by the medium frequency reactive magnetron sputtering technique using aluminum and terbium composite targets. It was found that under ultraviolet excitation with a wavelength of 254nm the films revealed yellowish green luminescence that was attributed to the transitions from 5D4 excited state to 7FJ multiplet ground states of Tb3+ ions. The observed emission has the spectral characteristics typical of radiative transitions among the electronic energy levels associated with the Tb3+ ion. The presence of Tb as well as the stoichiometry of these films have been determined by energy dispersive x-ray spectroscope (EDS) measurements. The crystalline structure of the sample was analysed by x-ray diffractometry (XRD). Auger electron spectroscopy has been used to estimate the stoichiometry of the films is also reported. This luminescence feature has an advantage for display techniques,which require three basic color emission.
机译:使用铝和ter复合靶,通过中频反应磁控溅射技术沉积了掺b的氧化铝膜(Al2O3:Tb)。发现在254nm波长的紫外线激发下,膜显示出黄绿色发光,这归因于从5D4激发态到Tb3 +离子的7FJ多重基态的转变。观察到的发射具有与Tb3 +离子相关的电子能级之间典型的辐射跃迁的光谱特征。 Tb的存在以及这些薄膜的化学计量已通过能量色散X射线光谱仪(EDS)测量确定。样品的晶体结构通过X射线衍射法(XRD)分析。已经报道了利用俄歇电子能谱法来估计膜的化学计量。该发光特征对于需要三种基本颜色发射的显示技术具有优势。

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