The relationship between triangle openOi and carrier recombination lifetime (CRT) is interpreted. A simple model for BMD formation is suggested and a relation between triangle openOi and CRT is be obtained from the relation between triangle openOi and BMD density. When triangle openOi is larger than about 1 ppma, r=K_3[BMD]~(0.087). This means that the size of BMD decreases very slightly along with the increase in its density. For triangle openOi smaller than about 1 ppma, it can be considered that both density and size of BMD are too small to affect the CRT. Effects of repeated heat treatments on the triangle openOi and on the CRT are also discussed.
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