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Derandomizing Graph Tests for Homomorphism

机译:同态去随机图测试

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In this article, we study the randomness-efficient graph tests for homomorphism over arbitrary groups (which can be used in locally testing the Hadamard code and PCP construction). We try to optimize both the amortized-tradeoff (between number of queries and error probability) and the randomness complexity of the homomorphism test simultaneously. For an abelian group G = Z_p~m, by using the λ-biased set S of G, we show that, on any given bipartite graph H = (V_1, V_2; E), the graph test for linearity over G is a test with randomness complexity |V_1|log|G| + |V_2|O(log|S|), query complexity |V_1| + |V_2| + |E| and error probability at most p~(-|E|) + (1 - p~(-|E|)) · δ for any f which is 1 - p~(-1)(1 + √δ~2-λ/2)-far from being affine linear. For a non-abelian group G, we introduce a random walk of some length, e say, on expander graphs to design a probabilistic homomorphism test over G with randomness complexity log |G| + O(log log |G|), query complexity 2e + 1 and error probability at most 1 -δ~2e~2/(δe+δ~2e~2-δ~2e)+2Ψ(λ,e) for any f which is 2δ/(1 - λ)-far from being affine homomorphism, here Ψ(λ, e) = ∑_(0≤i<j≤e-1 λ~(j-i-1)).
机译:在本文中,我们研究了任意组上同态性的随机有效图测试(可用于本地测试Hadamard代码和PCP构造)。我们尝试同时优化摊销折衷(在查询数量和错误概率之间)和同态测试的随机性复杂度。对于一个阿贝尔群G = Z_p〜m,通过使用G的λ偏集S,我们表明,在任何给定的二部图H =(V_1,V_2; E)上,关于G的线性的图检验是一个检验| V_1 | log | G | + | V_2 | O(log | S |),查询复杂度| V_1 | + | V_2 | + | E |且对于任何f为1-p〜(-1)(1 +√δ〜2-λ)的误差和至多p〜(-| E |)+(1- p〜(-| E |))·δ / 2)-远非仿射线性。对于非阿贝尔群G,我们在扩展图上引入一定长度的随机游走,例如,设计具有随机复杂度log | G |的G上的概率同态检验。 + O(log log | G |),查询复杂度2e +1和错误概率最大1-δ〜2e〜2 /(δe+δ〜2e〜2-δ〜2e)+2Ψ(λ,e) f为2δ/(1-λ)-远非仿射同态,这里Ψ(λ,e)= ∑_(0≤i<j≤e-1λ〜(ji-1))。

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