Orientation Imaging in the Transmission Electron Microscope

摘要

Orientation Imaging Microscopy (OIM) in the scanning electron microscope (SEM) has proven itself to be a powerful tool for investigating local orientation relationships in polycrystalline microstructures. Because of the inherent limitations of electron backscatter diffraction in the SEM, the OIM technique is limited to the investigation of structures at the micron scale. A parallel technique for the transmission electron microscope (TEM) would enable similar studies of local orientation relationships in smaller scale structures to be performed. This report reviews development work on adapting the OIM technique to the TEM using dark field imaging and presents some preliminary results.