首页> 外文会议>Symposium on Thin-Films - Stresses and Mechanical properties Vii, held December 1-5, 1997, Boston, Massachusetts, U.S.A. >Stress-strain curves by tensile testing at thin metallic films on thin polyimide foils: Al, AlCu, CuNi(Mn)
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Stress-strain curves by tensile testing at thin metallic films on thin polyimide foils: Al, AlCu, CuNi(Mn)

机译:通过拉伸试验在薄的聚酰亚胺箔上的金属薄膜上进行应力-应变曲线:Al,AlCu,CuNi(Mn)

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摘要

For better understanding the mechanical properties of thin films it is helpful to use the same experimental methods as for bulk material, like tensile tests, thereby being able to directly compare the results. However, tensile tests of free-standing metallic thin films are often difficult to perform for reasons of preparation, handling, and stresses in the films. By leaving the metallic film on an elastic substrate tensile tests were performed in a rather simple and precise manner, using a commercial tensile testing machine. Stress-strain curves were determined by separating the force working on the substrate from that working on the film-substrate compound. Those measurements were done at room temeprature for Al, AcCu(0.5 wt
机译:为了更好地了解薄膜的机械性能,使用与块状材料相同的实验方法(例如拉伸试验)是有帮助的,因此能够直接比较结果。然而,由于膜的制备,处理和应力的原因,通常难以进行自支撑金属薄膜的拉伸试验。通过将金属膜留在弹性基底上,使用市售的拉伸试验机以相当简单和精确的方式进行了拉伸试验。通过将作用在基材上的力与作用在薄膜-基材化合物上的力分开,可以确定应力-应变曲线。这些测量是在室温下对Al,AcCu(0.5 wt

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