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NANO-CREEP TEST FOR ANATASE POLYCRYSTALLINE FILMS

机译:锐钛型多晶薄膜的纳米蠕变测试

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摘要

We introduce an analytical technique for time-dependent deformation behavior of the polycrystalline films using a nano-indenter. This technique permits evaluation of structural deformation of the nanometer scale of the thin films. In this paper, good accuracy conditions were determined to measure deformation behavior of the polycrystalline films. The polycrystalline films of anatase were used to investigate the grain boundary structure. We prove that the analysis of time-dependent deformation behavior is effective to investigate the structure of the polycrystalline films.
机译:我们介绍了一种使用纳米压头的多晶膜随时间变化的变形行为的分析技术。该技术允许评估薄膜的纳米尺度的结构变形。在本文中,确定了测量多晶膜变形行为的良好精度条件。锐钛矿的多晶膜用于研究晶界结构。我们证明了时变变形行为的分析对于研究多晶膜的结构是有效的。

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