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Interferometer Type Pressure Microsensor

机译:干涉仪型压力微传感器

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摘要

In this work, the fabrication of waveguide and nitride silicon membrane is presented. The measurement configuration chosen to detect the variation produced in the light properties is an Interferometer configuration of the Mach Zehnder Type (MZI), because of its high sensitivity. One of its arms is positioned on a floating silicon nitride membrane that becomes deformed under small pressures on the range of MPa. According to the parameters of the membrane and the waveguide we obtain a maximum deformation of 176 nm that produces a change of phase of 180° between the two waves, producing therein a null interferometer output for the maximum pressure. The analyses of theory suggest that this device will be able to sense a pressure value up to13.376MPa.
机译:在这项工作中,提出了波导和氮化硅膜的制造。选择用于检测光特性变化的测量配置是Mach Zehnder类型(MZI)的干涉仪配置,因为它具有很高的灵敏度。它的一个臂位于浮动的氮化硅膜上,该膜在MPa范围内的小压力下会变形。根据膜片和波导的参数,我们获得176 nm的最大形变,在两个波之间产生180°的相位变化,从而在其中产生最大压力的零干涉仪输出。理论分析表明,该设备将能够感应高达13.376MPa的压力值。

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