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Production of InSb thin films through annealing Sb_2S_3-In thin films

机译:通过退火Sb_2S_3-In薄膜生产InSb薄膜

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摘要

A method to produce large area indium antimonide thin films through a reaction, Sb_2S_3 + 2 In -> InSb + 3 S arrow up is presented. a thin film of Sb_2S_3 with typically 0,2 um m thickness is produced on glass substrate by chemical bath deposition (CBD) at 10 deg C using thiosulfatoantimonate (III) complex. Subsequently, a thin film of indium is deposited on the Sb_2S_3 film by thermal evaporation. Annealing the thin film stack of Sb_2S_3-In at 300 deg C in a nitrogen atmosphere produces the InSb thin film. The formation of this film is confirmed by x-ray diffraction studies. We would discuss the optimization of the individual film thickness in the Sb_2S_3-In stack to produce a thin film of single phase InSb or a heterostructure, Sb_2S_2-InSb. The electrical and optical properties of the films are presented.
机译:提出了一种通过Sb_2S_3 + 2 In-> InSb + 3 S向上箭头反应生产大面积锑化铟薄膜的方法。使用硫代硫酸根锑酸盐(III)络合物在10摄氏度下通过化学浴沉积(CBD)在玻璃基板上生产出厚度通常为0.2 um m的Sb_2S_3薄膜。随后,通过热蒸发将铟薄膜沉积在Sb_2S_3膜上。在氮气气氛中在300℃下对Sb_2S_3-In的薄膜叠层进行退火,得到InSb薄膜。通过X射线衍射研究证实了该膜的形成。我们将讨论Sb_2S_3-In堆叠中单个膜厚度的优化,以生产单相InSb或异质结构Sb_2S_2-InSb的薄膜。介绍了薄膜的电学和光学性质。

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