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Water Adsorption and Friction on Thin Film Magnetic Recording Disks~©

机译:薄膜磁记录盘上的水吸附和摩擦〜©

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Water adsorption isotherms were measured with two differentrntypes of perfluropolyether lubricants, Zdol 4000 and Ztetraolrn2000, on thin film magnetic recording disks. The adsorptionrnisotherm provides the average water film thickness (areal density)rnas a function of relative humidity. The water film thickness wasrnmeasured while varying the relative humidity (RH) in the rangernfrom dry air to 85%. The water film thickness for both types ofrnlubricants increased with RH, and was independent of temperaturernbetween 20° and 50℃. The water film thickness at saturationrnRH was typically 0.44 nm (16m~2) for Zdol and 0.25 nm (9m~2)rnfor Ztetraol. Friction measurements were performed on the samernset of disks up 70% RH. The maximum friction increased with RH,rnmore for Zdol than for Ztetraol, and the friction with Ztetraol wasrnmuch less than with Zdol. Brief exposure to condensing RH dramaticallyrnaltered the friction and acoustic emission even at relativelyrnhigh slider flying height. The altered frictional propertiesrnwere associated with liquid nanodroplets formed on the disks duringrnthe brief condensation.
机译:用两种不同类型的全氟聚醚润滑剂Zdol 4000和Ztetraolrn2000在薄膜磁记录盘上测量了水吸附等温线。吸附热疗使平均水膜厚度(面密度)rnas成为相对湿度的函数。测量水膜厚度,同时在从干燥空气到85%的范围内改变相对湿度(RH)。两种润滑剂的水膜厚度均随RH的增加而增加,且与20°至50℃之间的温度无关。对于Zdol,饱和水在rhRH下的水膜厚度通常为0.44 nm(16 / nm〜2)rn,对于Ztetraol,水膜厚度通常为0.25 nm(9 / nm〜2)rn。在相对湿度最高为70%的同一盘片上进行摩擦测量。 RH时最大摩擦增加,Zdol的最大摩擦大于Ztetraol,Ztetraol的最大摩擦小于Zdol。即使在相对较高的滑块飞行高度下,短暂暴露于冷凝RH也会显着改变摩擦和声发射。摩擦特性的变化与短暂凝结过程中在圆盘上形成的液态纳米液滴有关。

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