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Phase detection deflectometry: an industrial solution for three-dimensional form measurement of aspheric and spheric surfaces

机译:相位检测偏折法:用于非球面和球面三维形状测量的工业解决方案

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Abstract: Angenieux has developed a device providing a fast, accurate, 3-D analysis of a large range of aspherical and spherical surfaces and wavefronts, from diamond turned IR components to molded or polished lenses and up to large astronomical mirrors. Measurements are achieved without the need for compensating tooling such as null-lenses or holograms. !5
机译:摘要:Angenieux开发了一种设备,可以对从金刚石车削的IR组件到模制或抛光的透镜以及大型天文镜等各种非球面和球面和波阵面进行快速,准确的3D分析。无需补偿工具(例如零镜头或全息图)即可实现测量。 !5

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