FEEDBACK CONTROL OF A MICHELSON INTERFEROMETER FOR ROUTINE LIFETIME CHARACTERIZATION IN CRYSTALLINE SILICON SOLAR CELLS

摘要

Material characterization in solar cell fabrication process is a key issue to improve quality and efficiency of the cell. In this paper we present a high accuracy non-contact measurement technique for the evaluation of bulk recombination lifetime and surface recombination velocity in single crystal silicon. The measurement setup accuracy is improved by feedback control which guarantees the optimum linearity and sensitivity to be achieved simultaneously.