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Linear Optical Response of Si_(1-x)Ge_x Compounds

机译:Si_(1-x)Ge_x化合物的线性光学响应

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Si_(1-x)Ge_x is a good candidate as a substitute material for Si in a low-power andhigh-speed semiconductor device technologies. Optical devices, such as heterojunction bipolartransistors, are already in industrial production. The samples are grown on Si(001) with both nandp-type impurities and with different Ge concentrations. The linear optical response of Si1-xGex is investigated theoretically using a full-potential linearized augmented plane wave methodwith respect to composition x. The calculated real and imaginary parts of the dielectric functionε(ω) = ε1(ω) + iε2(ω) were found to be in good agreement with recent spectroscopic ellipsometrymeasurements performed by Bahng et al., J. Phys.: Condens. Matter 13, 777 (2001). We alsoperform absorption measurements for different type of samples showing the variation of energygaps as a function of Ge concentrations.
机译:Si_(1-x)Ge_x是低功率和高速半导体器件技术中作为Si替代材料的良好候选者。诸如异质结双极晶体管的光学器件已经在工业生产中。样品在具有nandp型杂质和不同Ge浓度的Si(001)上生长。理论上,使用全电位线性化增强平面波方法对Si1-xGex的线性光学响应进行了研究。发现介电函数ε(ω)=ε1(ω)+iε2(ω)的计算的实部和虚部与Bahng等人在J. Phys .: Condens。等人最近进行的光谱椭偏测量法非常吻合。问题13,777(2001)。我们还对不同类型的样品进行吸收测量,表明能量隙随Ge浓度的变化而变化。

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    Instituto de Fisica Universidade Federal da Bahia Campus Universitario de Ondina 40210 340 Salvador Bahia Brazil;

    Instituto de Fisica Universidade Federal da Bahia Campus Universitario de Ondina 40210 340 Salvador Bahia Brazil Departamento de Ciencias Exatas area de Informatica Universidade Estadual de Feira de Santana 44031 460 Feira de Santana Bahia Brazil Instituto Nacional de Pesquisas Espaciais-INPE/LAS 12210- 970 S. J. dos Campos SP Brazil;

    Condensed Matter Theory Group Department of Physics Uppsala University SE-751 21 Uppsala Sweden;

    Departamento de Fisica Universidade Federal de Pernambuco Cidade Universitaria 50670 901 Recife PE Brazil;

    Department of Physics Chalmers University of Technology S-41296 Goeteborg Sweden;

    Applied Materials Physics Department of Materials Science and Engineering Royal Institute of Technology SE-100 44 Stockholm Sweden;

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