Imec, Kapeldreef 75, 3001 Heverlee, Belgium;
rnImec, Kapeldreef 75, 3001 Heverlee, Belgium;
rnImec, Kapeldreef 75, 3001 Heverlee, Belgium;
rnImec, Kapeldreef 75, 3001 Heverlee, Belgium;
rnCypress Belgium, Schalieenhoevedreef 20B, 2800 Mechelen, Belgium CMOSIS, Antwerp, Belgium;
rnGalileo Avionica, via A. Einstein 35, 50013 Campi Bisenzio (Firenze), Italy;
rnImec, Kapeldreef 75, 3001 Heverlee, Belgium;
rnImec, Kapeldreef 75, 3001 Heverlee, Belgium;
monolithic and hybrid CMOS imagers; backside thinning and processing; backside illumination; quantum efficiency; deep electrically isolating pixel separating trenches for low cross-talk; UV and Extreme UV response; through silicon vias; 3D imagers;
机译:HPD设置中的背面照明单片CMOS像素传感器的测试
机译:高分辨率,背面照明的单片有源像素传感器,用于低能电子成像
机译:带有auto薄和背面照明的整体式有源像素传感器设备的auto放射自显影
机译:单片和混合式背面照明有源像素传感器阵列
机译:测量有源像素传感器星相机的像素响应函数的实验技术
机译:采用四阱技术的单片有源像素传感器(MAPS)可实现接近100%的填充因子和完整的CMOS像素
机译:具有自偏置像素的CMOS单片有源像素传感器的辐射容限