A deterministic approach to the spatial origin of semiconductor device current noise for semiclassical transport

摘要

Performance of an electronic system can be greatly limited by its internal noise and can be employed as a measure to characterize the effectiveness of such systems. As a result, it is important to investigate electronic noise in semiconductor devices. Electronic noise is due to random events that take place inside electrical devices and the theoretical interpretation of these stochastic events is very important in order to accurately match a noise model to the observed results in experimental studies [1].