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Anomalous reflection of THz pulse, containing a few cycles, from absorbing layer: influence of absolute phase of the pulse on the medium response

机译:太赫兹脉冲的异常反射,包含几个周期,从吸收层反射:脉冲的绝对相位对介质响应的影响

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We analyze an interaction of THz pulse containing a few cycles with absorbing or transparent layer. The process under consideration is described by ID Maxwell's equations. This analysis is very important for problem of the detection and identification of substance because at the interaction of such THz pulse with layer, the pulse spectrum can essentially change in dependence of a layer thickness. As consequence, excitation of different energy levels occurs in spite of the spectrum unchanging for the incident pulse. Therefore, the medium response can change essentially due to changing of emission frequencies. We found out the non-monotonic dependence of a reflection coefficient from both absorption coefficient, and layer thickness, and absolute phase of the pulse. For the detection and identification of substances, this dependence leads to additional requirements with respect to the incident THz pulse spectrum. For absorbing layer, we see non-monotonic dependence of absorption energy from the layer thickness and its reflection coefficient. This dependence has maximum with changing of the absorption coefficient because a reflection of laser energy is a function of both dielectric permittivity of a medium and its absorption coefficient. Amplitude of reflected THz pulse depends in strong way from the absolute phase of incident THz pulse if the pulse duration is sufficient small.
机译:我们分析了包含吸收或透明层的几个周期的太赫兹脉冲的相互作用。 ID Maxwell的方程式描述了正在考虑的过程。该分析对于物质的检测和识别的问题非常重要,因为在这种太赫兹脉冲与层的相互作用下,脉冲频谱会根据层的厚度而发生本质上的变化。结果,尽管频谱对于入射脉冲不变,但仍发生了不同能级的激发。因此,介质响应可以基本上由于发射频率的变化而变化。我们从吸收系数,层厚度和脉冲的绝对相位中发现了反射系数的非单调依赖性。为了检测和识别物质,这种依赖性导致对入射THz脉冲频谱的额外要求。对于吸收层,我们从层厚度及其反射系数中看到吸收能量的非单调依赖性。这种依赖性随着吸收系数的变化而最大,因为激光能量的反射是介质的介电常数及其吸收系数的函数。如果脉冲持续时间足够短,则反射的太赫兹脉冲的幅度与入射太赫兹脉冲的绝对相位有很大关系。

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