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ZnO Thin Film Templates for GaN-based Devices

机译:用于GaN基器件的ZnO薄膜模板

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GaN-based optoelectronic devices are plagued by a tendency to non-radiative transitions linked to defects in the active layers. This problem has it's origin in a) intrinsic factors such'as GaN's relatively low exciton binding energy (~24meV) and b) extrinsic factors including the poor availability of native substrates good enough to significantly suppress the defect density. Indeed, the quality and availability of large-area bulk GaN substrates is currently considered a key problem for the continuing development of improved GaN-based devices. Since development of bulk GaN substrates of suitable quality has proven very difficult, a considerable amount of effort is also being directed towards the development of alternative substrates which offer advantages compared to those in widespread use (c-sapphire and 6H SiC). ZnO is promising as a substrate material for GaN because it has the same wurtzite structure and a relatively small lattice mismatch (~1.8%). In this paper, we discuss use of ZnO thin films as templates for GaN based LED.
机译:GaN基光电器件受到与有源层缺陷相关的非辐射跃迁趋势的困扰。这个问题的根源在于:a)诸如GaN的相对较低的激子结合能(〜24meV)之类的内在因素,以及b)包括天然衬底可用性差的外在因素,它们足以显着抑制缺陷密度。实际上,大面积的GaN衬底的质量和可用性目前被认为是持续开发改进的GaN基器件的关键问题。由于开发出质量合适的块状GaN衬底已被证明非常困难,因此,人们也在大力开发替代衬底,这些衬底与广泛使用的衬底(商用蓝​​宝石和6H SiC)相比具有优势。 ZnO具有相同的纤锌矿结构和相对小的晶格失配(〜1.8%),有望成为GaN的衬底材料。在本文中,我们讨论了将ZnO薄膜用作GaN基LED的模板。

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