首页> 外文会议>Quality Electronic Design, 2006. ISQED '06 >Session EP1: Power Management and Optimization Challenges for Sub 90nm CMOS Designs- What is the Real Cost of Long Battery Life?
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Session EP1: Power Management and Optimization Challenges for Sub 90nm CMOS Designs- What is the Real Cost of Long Battery Life?

机译:会议EP1:低于90nm CMOS设计的电源管理和优化挑战-延长电池寿命的实际成本是多少?

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摘要

The recent migration to DSM process geometries and very large gate counts, has created a need for low power design and multi-voltage designs as standard rather than the exception. The variety of power optimization and power planning tools has resulted in ad-hock modification to existing design flows to accommodate the new requirements. This has given rise to wide variation in the QOR of the silicon that incorporates these design features. The panel will review and discuss places in the design flow where power planning and optimization are beneficial to improving QOR and also some of the analysis and signoff limitations to the automation that is available and directed at this task.
机译:最近向DSM工艺几何结构和非常大的门数的迁移,导致对低功耗设计和多电压设计的需求成为标准,而不是例外。各种电源优化和电源计划工具已导致对现有设计流程进行临时修改,以适应新的要求。这引起了包含这些设计特征的硅的QOR的广泛变化。小组将审查和讨论设计流程中有利于改善QOR的电源规划和优化的地方,以及针对该任务可用的自动化分析和限制。

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