Development of Objective Type Atomic Force Microsocopy for PSISCM-Nanoindentation Combined System.

摘要

Nanoindentation test is known as instrumented indentation test (IIT) in the nano range for hardness and material parameters (ISO 14577). It is a simple and effective method for evaluating the mechanical properties such as elasticity/stiffness, hardness and adhesion. Generally NT is the method that doesn't have to observe the residual impression. However, it is necessary to observe the residual impression and surface of test piece to obtain the material behavior such as pile-up/sink-in, crack. In past work, the phase shifting interferometric scanning confocal microscope (PSISCM)-nanoindenataion combined system was developed to obtain the tilt of surface and the geometrical shape of residual impression that are deeper than one micron. This system is useful to obtain the geometrical shape of the surface of test piece in macro and micro range. However, it is well known that the results of nanoindentation test become unstable in the nano range. In this work, authors focused the geometry observation system for nanoindentation system. Confirmation the capability of PSISCM system and development of objective type atomic force microscopy to obtain the geometrical shape in nano range are examined. The AFM that has an excellent performance is developed by SII nanotechnology Inc. Japan, and it built into system. In many cases, it performs enough to observe the residual impression and the surface of the test piece. This system uses three methods to obtain the geometrical shape of surface in each range. Generally, AFM has the observation range at about several microns. It is difficult to search the small residual impression by only AFM. Before the observation of AFM, the observation area should be selected by using PSISCM. New measurement tool using PSISCM and AFM to obtain the surface geometry from macro range to nano range is proposed. This tool is very simple, quick and useful tool.