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Reliability Analysis of PBGA Electronic Package Under Sinusoidal Vibration Loading

机译:正弦振动载荷下PBGA电子封装的可靠性分析

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In order to research the sinusoidal vibration reliability of plastic ball grid array (PBGA) solder joints, sinusoidal vibration tests on PBGA specimens were designed. The specimens were subjected to three kinds of different vibration excitations around the 1st natural frequency during the tests. Because the size of solder joint is too small to measure the stress directly, the resistances of solder joints were monitored in real time to obtain the failure time of the electronic components. Two-parameter Weibull distribution model was used to analyze the test results, metallurgical cross-sections analysis was conducted on the failed solder joints to identify the failure modes and mechanisms. In the paper, finite element analysis was implemented to obtain the stress of solder joints by the software ABAQUS, the finite element model was then used to obtain the specimens' weight, natural frequency and acceleration amplitude, and the results were compared to experimental values to ensure the accuracy of the finite element model. Finally the results of the vibration tests and finite element analysis were combined to create S-N curve of the solder joints under vibration conditions.
机译:为了研究塑料球栅阵列(PBGA)焊点的正弦振动可靠性,设计了PBGA标本的正弦振动测试。在测试过程中,样品在第一自然频率附近受到三种不同的振动激励。由于焊点的尺寸太小,无法直接测量应力,因此需要实时监控焊点的电阻,以获得电子元件的故障时间。采用两参数威布尔分布模型对测试结果进行分析,并对失效焊点进行冶金截面分析,确定失效模式和机理。在本文中,通过ABAQUS软件进行了有限元分析来获得焊点的应力,然后使用有限元模型来获得试件的重量,固有频率和加速度振幅,并将结果与​​实验值进行比较以得出确保有限元模型的准确性。最后,将振动测试和有限元分析的结果相结合,以创建在振动条件下焊点的S-N曲线。

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