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VOLATILE SINGLE-SOURCE PRECURSORS FOR THE MOCVD OF METAL SILICATE THIN FILMS

机译:金属硅酸盐薄膜气相沉积的挥发性单源前体

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摘要

The synthesis and characterisation of two novel complexes namely zirconium bis(trimethylsilinolate)bis(tert-butylacetoacetate) (1) and hafnium bis(trimethylsilinolate)bis(tert-butylacetoacetate) (2) are reported in view of the potential applications as single source precursors for depositing metal silicate thin films by MOCVD. Solid state structure of [Zr(OSiMe_3)_2(tbaoac)_2] revealed the complex to be a six coordinated monomer. Thermal analyses showed the utility of 1 and 2 as promising single-source precursors for the MOCVD of respective metal silicate films. MOCVD carried out using the new precursors over a wide temperature range of 400-800℃ indicated dense and uniform films of composition M_(1-x)Si_xO_2 (M = Zr, Hf) on Si(100) substrate. The film composition was found to be dependent on the deposition temperature where the Si content varied with deposition temperature.
机译:考虑到作为单源前体的潜在应用,报道了两种新型配合物的合成和表征,即双(三甲基硅烷基硅酸酯)双(叔丁基乙酰乙酸酯)(1)和双(三甲基硅烷基磺酸盐)双(叔丁基乙酰乙酸)ha(2)。通过MOCVD沉积金属硅酸盐薄膜。 [Zr(OSiMe_3)_2(tbaoac)_2]的固态结构表明该络合物为六配位单体。热分析表明,1和2可用作相应的金属硅酸盐薄膜MOCVD的有前途的单源前体。使用新的前体在400-800℃的宽温度范围内进行的MOCVD表明,在Si(100)衬底上具有致密且均匀的M_(1-x)Si_xO_2(M = Zr,Hf)组成的薄膜。发现膜组成取决于沉积温度,其中Si含量随沉积温度变化。

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