首页> 外文会议>Proceedings of the seventh international conference on reliability,maintainability and safety (I) >AN OPTIMIZED ALGORITHM FOR CALCULATING TOPEVENT FAILURE PROBABILITY OF FAULT TREE BASED ON THE BINARY DECISION DIAGRAMS TECHNIQUE
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AN OPTIMIZED ALGORITHM FOR CALCULATING TOPEVENT FAILURE PROBABILITY OF FAULT TREE BASED ON THE BINARY DECISION DIAGRAMS TECHNIQUE

机译:基于二元决策图技术的故障树热电偶失效概率计算优化算法

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摘要

Fault tree analysis technique is often used to calculate the topevent failure probability of the numeration system. The traditional fault tree analysis is often up against the bottleneck of accuracy and efficiency when dealing with large fault tree structures. The Binary Decision Diagram (BDD) is highly efficient and precise in calculating the top event probability by computer This paper aims to provide an algorithm of fault tree by using an optimized calculation or analysis method of the BDD technique.
机译:故障树分析技术通常用于计算分子系统的最高事件失败概率。当处理大型故障树结构时,传统的故障树分析通常会遇到准确性和效率瓶颈。二叉决策图(Binary Decision Diagram,BDD)在计算机上计算最高事件概率方面是高效且精确的。本文旨在通过使用BDD技术的优化计算或分析方法,提供一种故障树算法。

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