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Development of Technique for Making Ohmic Contacts to PEDOT-PSS Films

机译:与PEDOT-PSS薄膜进行欧姆接触的技术开发

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摘要

Conducting polymers (PEDOT-PSS) belong to a category of materials which are peizoresitive and are used in variety of applications like strain gauges, gas sensors and many more. Since these conducting polymers are semiconductors, four probe measurement of film resistance is necessary to avoid errors due to contact resistance and spreading resistances. In a device, it is cumbersome to make four probe measurements and convenient to make two probe measurements. Large differences in the work function of polymers and contacts metals lead to rectifying contacts rather than ohmic contacts. A two probe measurement technique of making ohmic contacts to PEDOT-PSS film pristine and doped with 5 % DMSO is presented. It has been shown that by coating the contact probes with carbon nano powder, ohmic contacts can be achieved. This method can be employed for all conducting polymer measurements.
机译:导电聚合物(PEDOT-PSS)属于一种材料,其是peosoresitive,用于各种应用程序,如应变仪,气体传感器等。由于这些导电聚合物是半导体,因此必须对薄膜电阻进行四探针测量,以避免由于接触电阻和铺展电阻引起的误差。在设备中,进行四个探头测量很麻烦,并且方便进行两个探头测量。聚合物和金属触点的功函数差异很大,会导致整流触点而不是欧姆触点。提出了两种探针测量技术,该技术可以使PEDOT-PSS薄膜原始欧姆接触并掺杂5%DMSO。已经表明,通过用碳纳米粉末涂覆接触探针,可以实现欧姆接触。该方法可用于所有导电聚合物的测量。

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