Cores-unified test application for hierarchical SoC

摘要

The hierarchical SoC can't parallel test with IEEE1500 wrapper cell directly,a modified wrapper scan cell based on the IEEE1500 standard is proposed.The prior parallel test optimization for hierarchical SoC only considers single core's scan chains,this leads to TAM transmits large amounts of independent test data.In this paper cores-unified test is presented for hierarchical SoC that more than one core test are unified into a single one.Experimental results with ITC'02 SoC test benchmarks indicate that cores-unified test application can improve the efficiency of TAM that transmits core test data and can further reduce hierarchical SoC test application time than core-independent test application for hierarchical SoC.