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The role of microstructure and surface topography in the electrical behavior of Sn-coated Cu contacts

机译:微观结构和表面形貌在镀锡铜触点电行为中的作用

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An electrical connector must present low and stable contact resistance while being highly resistant against mechanical wear. In order to achieve this we explore the effect of laser surface texturing (LST) on the static resistance of Sn-plated Cu contacts. We study the evolution of the electrical resistance between textured contacts and an Au-coated hemispherical tip under normal loading. The microstructure and topography of the contact surface was analyzed using white light interferometry (WLI), focused ion beam (FIB), scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX). LST induces surface softening and reduced electrical contact resistance under loading. The resistance vs load behavior of the laser-textured contact follows the Holm model, indicating that plastic deformation governs the electrical resistance. We claim that avoiding surface material pile-up and that insulating layer collapse reduces the resistance hysteresis during operational mating and unmating cycles.
机译:电连接器必须具有低而稳定的接触电阻,同时具有高度的机械耐磨性。为了实现这一点,我们探索了激光表面纹理化(LST)对镀锡的铜触点的静态电阻的影响。我们研究了正常负载下织构触点与Au涂层半球形尖端之间电阻的演变。使用白光干涉法(WLI),聚焦离子束(FIB),扫描电子显微镜(SEM)和能量色散X射线光谱(EDX)分析了接触表面的微观结构和形貌。 LST引起表面软化并降低负载下的电接触电阻。激光织构触点的电阻与负载行为遵循Holm模型,表明塑性变形决定了电阻。我们声称,避免表面材料堆积和绝缘层塌陷可减少操作配合和非配合循环期间的电阻滞后现象。

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