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Simulation-based Analysis of Inductance at Loose Connector Contact Boundaries

机译:基于仿真的松连接器接触边界处的电感分析

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Loose connectors connecting electric devices increase electromagnetic radiation. Previous studies indicate that loose connectors inherently increase inductance and resistance at connection contact boundaries, and such increased inductance is a dominant factor in increasing the intensity of electromagnetic radiation especially when devices work in high-frequency bands. In this paper, to investigate the mechanism of increased inductance at loose connector contact boundaries, we compute the value of current density at contact points and the strength of the magnetic field in the area around the connector cross section. Our simulation results show that current curves along the circumferential directions of a cable due to loose connectors. Extended current paths resulting from that bypass current arise sectionally, and the effect of the bypass current can be regarded as the main factor in increasing inductance. We also clarify an increased inductance trend arising from loose connectors based on the length of the noncontact areas in the contact boundary surface.
机译:连接电子设备的连接器松动会增加电磁辐射。先前的研究表明,松动的连接器会固有地增加连接触点边界处的电感和电阻,而这种增大的电感是增加电磁辐射强度的主要因素,尤其是当设备在高频带下工作时。在本文中,为了研究在松动的连接器接触边界处电感增加的机理,我们计算了接触点处的电流密度值以及连接器横截面周围区域中的磁场强度。我们的仿真结果表明,由于连接器松动,电流沿电缆圆周方向弯曲。由该旁路电流引起的扩展电流路径部分地出现,并且旁路电流的影响可以视为增加电感的主要因素。我们还根据接触边界表面中非接触区域的长度,阐明了由于连接器松动而引起的电感趋势的增加。

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