NANOMETROLOGY INTERFEROMETRIC SYSTEM FOR LOCAL PROBE MICROSCOPY

摘要

This work deals with the measuring in the nanoscale through local probe microscopy techniques, primarily the AFM microscopy. We present a new design of the six-axes dimensional interferometric measurement tool for local probe microscopy stage nanopositioning with the compensation system of angle errors. The measurement tool is powered by solid-state frequency-doubled Nd:YAG laser stabilized by linear absorption spectroscopy with the help of a new type of iodine absorption cell based on borosilicate glass material.