首页> 外文会议>Proceedings of the 2018 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering >Investigation of a program-controlled process of impregnation of porous semiconductors with silver nanoparticles to create an electrical contact
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Investigation of a program-controlled process of impregnation of porous semiconductors with silver nanoparticles to create an electrical contact

机译:用银纳米颗粒浸渍多孔半导体以产生电接触的程序控制过程的研究

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The original idea is to deposit metal layers from concentrated solutions of colloidal inks of metal nanoparticles (silver) in a programmable pattern using methods of modified 3D extrusion with syringe dispenser, followed by thermal and electrodiffusion bonding of the nanostructured metal layer in the presence of a strong electric field. Porous semiconductor structures based on monocrystalline silicon of n- and p-type electrical conductivity with different resistivity were obtained by the method of electrochemical etching of the initial plate in electrolytes based on hydrofluoric acid. For the analysis of the hydrophobicity - hydrophilicity condition and, accordingly, the wettability of porous semiconductor structure, a specially developed apparatus was used, based on measuring the contact angle of wetting by the spreading drop method. To study the morphology of the surface of the obtained samples, the methods of scanning electron (Mira TESCAN II) and scanning-probe (Integra Terma) microscopy were used.
机译:最初的想法是使用改进的3D挤出和注射器分配器的方法,以可编程的图案从金属纳米粒子(银)的胶体油墨的浓溶液中沉积金属层,然后在存在纳米粒子的情况下进行热扩散和电扩散键合强电场。通过以氢氟酸为基础的电解质中初始板的电化学刻蚀方法,获得了具有不同电阻率的n型和p型电导率的单晶硅的多孔半导体结构。为了分析疏水性-亲水性条件,并因此分析多孔半导体结构的润湿性,基于通过滴落法测量润湿的接触角,使用专门开发的设备。为了研究获得的样品的表面形态,使用了扫描电子(Mira TESCAN II)和扫描探针(Integra Terma)显微镜的方法。

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