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Digital logic simulation models and evolving technology

机译:数字逻辑仿真模型和不断发展的技术

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摘要

Digital logic simulators have traditionally served three functions for the designer; those are logic verification, design verification (detailed timing analysis), and fault analysis.

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Logic verification is well understood and accurate models have existed for this purpose for some time. Design verification has improved steadily over recent years and very accurate models exist for gate-level analysis. Fault analysis has progressed much more slowly, and most models currently used are quite limited.

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This paper details the evolution of models used in performing the three functions, and discusses current strategy; especially with respect to timing analysis and fault insertion. Current fault and timing models are discussed in light of current technology, with emphasis on the applicability of faults to such devices as emitter coupled logic and MOS-LSI. Adequate model detail for an integrated circuit based on knowledge of package terminal behavior is discussed, and certain problems encountered in adequate modeling of complex functions (such as multi-phase memories) are presented.

机译:

传统上,数字逻辑模拟器为设计人员提供了三种功能:这些是逻辑验证,设计验证(详细时序分析)和故障分析。 rn

逻辑验证已广为人知,为此目的已经存在一些精确的模型。近年来,设计验证已稳步提高,并且存在用于门级分析的非常准确的模型。故障分析进展缓慢,目前使用的大多数模型都非常有限。 rn

本文详细介绍了用于执行这三个功能的模型的演变,并讨论了当前的策略;特别是在时序分析和故障插入方面。根据当前技术讨论了当前的故障和时序模型,重点是故障在发射极耦合逻辑和MOS-LSI等设备上的适用性。讨论了基于封装端子行为知识的集成电路的详细模型细节,并提出了在复杂功能(例如多相存储器)的适当建模中遇到的某些问题。

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