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Semipolar III-Nitride laser diodes for solid-state lighting

机译:半固态III型氮化物激光二极管,用于固态照明

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摘要

Several hurdles to further enhance the performance of semipolar III-Nitride laser diodes are addressed in this work.Particularly, we focused on improving their high operating voltage by thinning the p-GaN cladding layer and utilizing atransparent conductive oxide p-contact. On-wafer optical absorption measurements showed that a further reduction involtage with thinner p-GaN was limited by increased optical loss due to increased mode overlap with the ITO/metalanode. In separate attempts to minimize bulk-related optical losses, we implemented a new design that consisted of anAlGaN electron blocking layer (EBL) placed remotely from the quantum wells (QWs) and a low p-waveguide Mgdoping profile. A very low optical loss of about 2 cm~(-1) was extracted but the net improvement in differential efficiencywas limited by lower internal injection efficiency due to carrier accumulation in the p-waveguide region. With anoptimized design, that consisted of a lightly doped EBL close to the QWs and a UID p-waveguide, an improved lightoutput power of 1.4 W at 1.5 A and a low threshold current density of 1.2 kA/cm~2 were obtained.
机译:\ r \ n特别是,我们致力于通过减薄p-GaN覆盖层并利用透明导电氧化物来提高它们的高工作电压。\ r \ n p接触。晶片上的光吸收测量结果表明,由于与ITO /金属阳极的模式重叠增加,光损耗增加,限制了p-GaN薄膜厚度的进一步降低。为了最大程度地减少与体积相关的光损耗,我们实施了一项新设计,该设计由远离量子阱(QW)放置的\ r \ nAlGaN电子阻挡层(EBL)和低p波导Mg \ r \ ndoping组成轮廓。提取了非常低的大约2 cm〜(-1)的光损耗,但是由于p波导区域中载流子的积累,差分效率的净提高受到内部注入效率降低的限制。经过优化的设计,该器件由靠近QW的轻掺杂EBL和UID p波导组成,在1.5 A时光输出功率提高到1.4 W,在1.5 A时阈值电流密度低,仅为1.2 kA /获得了cm〜2。

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  • 来源
    《Novel In-Plane Semiconductor Lasers XVIII 》|2019年|109390G.1-109390G.6|共6页
  • 会议地点 0277-786X;1996-756X
  • 作者单位

    Materials Department, University of California, Santa Barbara, California 93106, USA;

    Materials Department, University of California, Santa Barbara, California 93106, USA;

    Materials Department, University of California, Santa Barbara, California 93106, USA;

    Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, USA;

    Materials Department, University of California, Santa Barbara, California 93106, USA Laboratoire de Physique de la Matière Condensèe, CNRS, Ecole Polytechnique, 91128 Palaiseau, France;

    Materials Department, University of California, Santa Barbara, California 93106, USA;

    Materials Department, University of California, Santa Barbara, California 93106, USA Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, USA;

    Materials Department, University of California, Santa Barbara, California 93106, USA Electrical and Computer Engineering Department, University of California, Santa Barbara, California 93106, USA;

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