School of Materials Science and Engineering, University of Jinan, Jinan 250022, China;
Faculty of material Optoelectronic physics, Xiangtan University, Hunan, 411105, China Key Laboratory of Low Dimensional Materials Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan, 411105, China;
Ferroelectric thin film; Fatigue; Imprint; Retention; interfacial layer;
机译:薄铁电聚偏氟乙烯-三氟乙烯共聚物薄膜电容器的极化保持
机译:铁电离子导体中的异常偏振切换和永久保留
机译:铁电局部极化的编程脉冲依赖性:PZT和HZO电容器对比研究的见解
机译:铁电电容器的频率漂移和极化保持损耗的频率依赖性
机译:铁电/电极接口:非易失性存储器中PZT电容器的极化切换和可靠性
机译:有机铁电电容器的极化疲劳
机译:薄铁电聚偏氟乙烯-三氟乙烯共聚物薄膜电容器的极化保持
机译:用扫描力显微镜研究铁电薄膜偏振保持损耗的纳米尺度