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Characterization of Siloxane Adsorbates Covalently Attached to TiO_2

机译:共价附着在TiO_2上的硅氧烷吸附剂的表征

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Siloxanes with the general formula R-(CH_2)_n-Si-(OR')_3 form durable bonds with inorganic materials upon hydrolysis of labile -OR' groups, and serve as robust coupling agents between organic and inorganic materials. In the field of dye-sensitized solar cells, functionalization of TiO_2 thin-films with siloxane adsorbates has been shown to be useful as a surface-passivation technique that hinders recombination processes and improves the overall efficiency of light-to-electricity conversion. However, the attachment of siloxane adsorbates on TiO_2 surfaces still remains poorly understood at the molecular level. In this paper, we report the characterization of 3-(triethoxysilyl) propionitrile (TPS) adsorbates, covalently attached onto TiO_2 surfaces. We combine synthetic methods based on chemical vapor deposition, Fourier transform (FT) infrared (IR) spectroscopy and electronic structure calculations based on density functional theory (DFT). We predict that trifunctional siloxanes form only 2 covalent bonds, in a 'bridge' mode with adjacent Ti~(4+) ions on the TiO_2 surface, leaving 'dangling' alkoxy groups on the surface adsorbates. Our findings are supported by the observation of a prominent fingerprint band at 1000-1100 cm~(-1), assigned to Si-O-C stretching modes, and by calculations of binding enthalpies at the DFT B3LYP/(LACVP/6-31G~(**)) level of theory indicating that the 'bridge' binding (ΔH_b = -55 kcal mol~(-1)) is more stable than 'tripod' motifs (ΔH_b = -45 kcal mol~(-1)) where siloxanes form 3 covalent bonds with the TiO_2 surface. The alkoxysiloxane groups are robust under heat and water treatment and are expected to be particularly relevant for analytical methods since they could be exploited for immobilizing other functionalities onto the TiO_2 surfaces.
机译:通式为R-(CH_2)_n-Si-(OR')_ 3的硅氧烷在不稳定的-OR'基团水解后会与无机材料形成持久键,并用作有机材料与无机材料之间的牢固偶联剂。在染料敏化太阳能电池领域,已证明用硅氧烷吸附剂对TiO_2薄膜进行功能化可用作表面钝化技术,该技术会阻碍复合过程并提高光电转换的整体效率。但是,在分子水平上,仍然难以理解硅氧烷吸附物在TiO_2表面上的附着。在本文中,我们报告了共价附着在TiO_2表面上的3-(三乙氧基甲硅烷基)丙腈(TPS)吸附物的表征。我们结合了基于化学气相沉积,傅立叶变换(FT)红外(IR)光谱和基于密度泛函理论(DFT)的电子结构计算的合成方法。我们预测三官能团硅氧烷仅以“桥”模式与TiO_2表面上的相邻Ti〜(4+)离子形成2个共价键,而在表面吸附物上留下“悬挂”的烷氧基。我们的发现得到以下支持:在1000-1100 cm〜(-1)处观察到一个明显的指纹带,该指纹带分配给Si-OC拉伸模式,并且通过计算DFT B3LYP /(LACVP / 6-31G〜( **))理论水平,表明“桥”键(ΔH_b= -55 kcal mol〜(-1))比“三脚架”基序(ΔH_b= -45 kcal mol〜(-1))更稳定,其中硅氧烷与TiO_2表面形成3个共价键。烷氧基硅氧烷基团在热处理和水处理下是坚固的,并且由于可以用于将其他官能团固定在TiO_2表面上,因此有望与分析方法特别相关。

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