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Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides

机译:平面五氧化二钽波导中的无参Chi 3色散测量

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We utilize analysis of third harmonic generation under femtosecond pulsed excitation as a reference free measurement method for third order nonlinear susceptibility (χ~((3)) or "Chi 3") of planar waveguides. We investigate χ~((3)) dispersion in planar Ta_2O_5 waveguides at wavelengths either side of the telecoms window, obtaining a nonlinear coefficient ofrn2 × 10~(-13) esu, at 1550 nm. Our study indicates that χ~((3)) increases within the measured wavelength range due to a three-photon resonance of Ta_2O_5 electrons, revealing the potential of this material system in high speed integrated nonlinear optical switches for the telecommunications spectral window.
机译:我们利用飞秒脉冲激励下三次谐波的产生作为平面波导三阶非线性磁化率(χ〜((3))或“ Chi 3”)的无参考测量方法。我们研究了平面Ta_2O_5波导在电信窗口任一侧波长处的χ〜((3))色散,在1550 nm处获得了rn2×10〜(-13)esu的非线性系数。我们的研究表明,由于Ta_2O_5电子的三光子共振,在测得的波长范围内χ〜((3))增大,从而揭示了该材料系统在高速集成非线性光学开关中用于电信光谱窗口的潜力。

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