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PbTe thin films grown by femtosecond pulsed laser deposition

机译:飞秒脉冲激光沉积生长的PbTe薄膜

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摘要

PbTe thin films were grown on BK7 glass and Si(100) substrates using femtosecond pulsed laser deposition at room temperature. The influence of the background pressure and the laser fluence on the structural and optical characteristics of the PbTe films was studied. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) were used to characterize the surface and structural properties of the deposited PbTe thin films, respectively. Transmission spectroscopy measurements in the visible and infrared region (VIS-IR) were used to investigate the optical properties of the PbTe thin films.
机译:在室温下使用飞秒脉冲激光沉积,在BK7玻璃和Si(100)衬底上生长PbTe薄膜。研究了背景压力和激光能量密度对PbTe薄膜结构和光学特性的影响。扫描电子显微镜(SEM)和X射线衍射(XRD)分别用于表征沉积的PbTe薄膜的表面和结构性质。可见光和红外区的透射光谱测量(VIS-IR)用于研究PbTe薄膜的光学性能。

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