State University of New York Polytechnic Institute - CNSE, 257 Fuller Rd. Albany, NY 12203 MMurphy@sunypoly.edu;
State University of New York Polytechnic Institute - CNSE, 257 Fuller Rd. Albany, NY 12203;
State University of New York Polytechnic Institute - CNSE, 257 Fuller Rd. Albany, NY 12203;
State University of New York Polytechnic Institute - CNSE, 257 Fuller Rd. Albany, NY 12203;
State University of New York Polytechnic Institute - CNSE, 257 Fuller Rd. Albany, NY 12203;
机译:含有锑的EUV光致抗蚀剂的同位素标记研究
机译:含锑的EUV光致抗蚀剂的同位素标记研究
机译:聚(烯烃砜)的极紫外(EUV)降解:有望用作EUV光刻胶
机译:TOF-SIMS锑羧酸盐EUV光致抗蚀剂分析
机译:EUV光致抗蚀剂暴露的二次电子相互作用
机译:EUV光刻胶的分子模型揭示了链构象对线边缘粗糙度形成的影响
机译:紫外线辐照引起的克里索诺维罗克光致抗蚀剂表面的化学状态变化的TOF-SIMS分析。