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Issues affecting the characterization of integrated optical devices subjected to ionizing radiation

机译:影响经受电离辐射的集成光学器件的特性的问题

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Abstract: We examine measurement issues which arise in the testing of integrated optical devices subjected to ionizing radiation. Many of these issues are not addressed by measurement procedures developed for optical fibers. We outline the complexities involved in the measurement of integrated optics as they relate to size, function, and materials. Pertinent waveguide parameters include attenuation, changes in refractive index, photorefractive effects, and polarization effects. Optical measurement techniques are reviewed, with particular attention paid to spatial and temporal resolution, dynamic range, and the capacity for remote measurement. Suggestions are made to improve the reliability of testing and allow better comparison between laboratories.!
机译:摘要:我们研究了在经受电离辐射的集成光学设备的测试中出现的测量问题。为光纤开发的测量程序无法解决其中许多问题。我们概述了集成光学测量中涉及尺寸,功能和材料的复杂性。相关的波导参数包括衰减,折射率变化,光折射效应和偏振效应。回顾了光学测量技术,尤其关注空间和时间分辨率,动态范围和远程测量能力。建议提高测试的可靠性,并允许在实验室之间进行更好的比较。

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