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The fast measurement of a mild asphere by the vibration-modulated sub-aperture stitching interferometer

机译:振动调制子孔径拼接干涉仪快速测量轻度非球面

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Sub-aperture testing methods are widely used in optical shops to test surface deformations of large diameter, high numerical aperture, or aspherical lens surfaces. We are proposing a novel 4 axis vibration modulated interferometer for subaperture testing. This interferometer takes advantage of the rotationally symmetric property of the optical lens and measures the lens surface against its symmetry axis rotationally. By adapting a synchronous random phase modulation measurement, interferometric data is acquired on the fly when the lens is being rotated. The vibration modulated interference phase is then calculated and stitched into a complete lens surface map by least squared fitting. This method has advantages over the prior methods in that it acquires the interferogram in a much shorter acquisition time, even with lower requirements on the optics and mechanical hardware. The stitch error is then significantly decreased by increasing both the lateral resolution of sub-aperture and the reduced position uncertainty of the stitched sub-aperture phase maps. A measurement on a mild asphere is demonstrated to prove the feasibility of the proposed interferometer.
机译:子孔径测试方法已在眼镜店广泛使用,以测试大直径,高数值孔径或非球面镜片表面的表面变形。我们提出一种新颖的4轴振动调制干涉仪,用于亚孔径测试。该干涉仪利用光学透镜的旋转对称特性,并相对于其对称轴旋转测量透镜表面。通过调整同步随机相位调制测量,可以在旋转镜头时动态获取干涉数据。然后计算振动调制的干涉相位,并通过最小二乘拟合将其缝合到完整的透镜表面图中。与现有方法相比,该方法的优点在于,即使对光学和机械硬件的要求较低,它也可以在更短的获取时间内获取干涉图。然后,通过增加子孔径的横向分辨率和减少缝合子孔径相位图的位置不确定性,可以显着降低缝合误差。演示了在温和的非球面上进行的测量,以证明所提出的干涉仪的可行性。

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