A sideband interrogation method for precise measurement of resonance frequency difference between interferometers

机译：一种精确测量干涉仪之间共振频率差的边带询问方法

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摘要

A novel sideband interrogation method was developed for precise measurement of resonance frequency difference between interferometers. Frequency resolution better than 29 kHz was experimentally demonstrated with a pair of fiber Fabry-Perot interferometers.

机译：开发了一种新颖的边带询问方法，用于精确测量干涉仪之间的谐振频率差。一对光纤Fabry-Perot干涉仪通过实验证明了优于29 kHz的频率分辨率。

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来源
《Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2012 and the National Fiber Optic Engineers Conference》|2012年|p.1- 3|共3页
会议地点 Los Angeles CA(US)
作者
Liu Qingwen;
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作者单位

Department of Electrical Engineering and Information Systems, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan;

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会议组织
原文格式 PDF
正文语种 eng
中图分类光波通信、激光通信;
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A sideband interrogation method for precise measurement of resonance frequency difference between interferometers

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