Department of Science, Borough of Manhattan Community College of City University of New York, 199 Chambers Street N645, New York, NY 10007;
Institute of Ultrafast Spectroscopy and Lasers, Department of Physics, City College of New York of City University of New York, 160 Convent Avenue J201, New York, NY 10031;
Department of Science, Borough of Manhattan Community College of City University of New York, 199 Chambers Street N645, New York, NY 10007;
Institute of Ultrafast Spectroscopy and Lasers, Department of Physics, City College of New York of City University of New York, 160 Convent Avenue J201, New York, NY 10031;
Institute of Ultrafast Spectroscopy and Lasers, Department of Physics, City College of New York of City University of New York, 160 Convent Avenue J201, New York, NY 10031;
black silicon; photocurrent; annealing; conductivity;
机译:硫掺杂的TiO2薄膜电极的光电化学性质:通过光电流测量表征掺杂态
机译:黑磷光电探测器的超快速光电流测量
机译:通过在非晶硅上的调制光电流测量来确定陷阱-陷阱事件,重组过程和能隙状态参数
机译:掺杂黑色硅的光电流谱测量
机译:使用太赫兹时域光谱(THz-TDS)通过电化学阳极氧化法测量硅中的掺杂分布。
机译:嵌入SiO2的硅纳米晶体的二维阵列中的横向电传输光学性质和光电流测量
机译:通过光电流测量研究的水和有机化合物对碳掺杂钛二氧化钛的光氧化反应的机制
机译:Gaas的硅和铟掺杂:掺杂对力学行为影响的测量及与位错形成的关系