A coarse-grained tight binding method for electrostatic analysis of nanoelectromechanical systems (NEMS)

摘要

A coarse-grained tight binding (CG-TBA) approach is presented for electrostatic analysis of NEMS. The key idea is to represent the entire NEM structure with a minimal number of unit cells but to accurately compute the electronic properties. The approach significantly reduces the computational cost but maintains the accuracy of the full TBA analysis.