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An all-optical protocol to determine the molecular origin of radiation damage/enhancement in electro-optic polymeric materials

机译:用于确定电光聚合物材料中辐射损伤/增强作用的分子起源的全光学方案

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摘要

Previous studies on the radiation effects upon polymer and polymer-based photonic materials suggest that the radiation resistance of the material is heavily dependent on the choice of polymer-host and guest-chromophore. To date, the best results have been achieved with electro optic polymeric materials based on CLD1 doped in APC, which has resulted in improved performance at the device level upon gamma-ray irradiation at moderate doses. However, the physical mechanisms are yet not fully understood. In this paper, we introduce an all-optical (linear and nonlinear) characterization protocol that is aimed to elucidate the mechanisms of the radiation damage/enhancement of electro-optic polymeric materials. This protocol is used to quantify the damage/enhancement effects upon irradiation in terms of the relevant physical parameters on a collection of electro-optic polymeric thin film samples.© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
机译:先前对聚合物和基于聚合物的光子材料上的辐射效应的研究表明,材料的抗辐射性在很大程度上取决于聚合物主体和客体发色团的选择。迄今为止,使用掺杂在APC中的基于CLD1的电光聚合物材料已经取得了最佳结果,这在中等剂量的γ射线辐照下已导致器件级的性能提高。但是,物理机制尚未完全理解。在本文中,我们介绍了一种全光学(线性和非线性)表征协议,旨在阐明电光聚合物材料的辐射损伤/增强机制。该协议用于根据电光聚合物薄膜样品集合上的相关物理参数来量化辐照时的伤害/增强效应。©(2012)COPYRIGHT光电仪器工程师协会(SPIE)。摘要的下载仅允许个人使用。

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