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Strong photoluminescence caused by optical transitions between electron and hole Tamm-like interface states in ZnSe/BeTe heterostructures

机译:ZnSe / BeTe异质结构中电子与空穴Tamm状界面态之间的光学跃迁引起的强光致发光

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摘要

We present an experimental data, which demonstrate a basically new mechanism of carrier radiative recombination in semiconductor heterostructures - recombination via Tamm-like interface states. Bright line was observed in photoluminescence spectra of periodical ZnSe/BeTe heterostructures at the energies, which correspond to the optical transitions between electron and hole Tamm-like interface states in studied heterosystem. Photoluminescence via Tamm-like interface states was observed for wide range excitation densities in the temperature range from 15K to 160K. It was found that for short-period ZnSe/BeTe heterostructures at low temperatures and at low excitation densities photoluminescence via Tamm-like interface states is much stronger than conventional interband radiative recombination.
机译:我们提供了一个实验数据,该数据证明了半导体异质结构中载流子辐射复合的基本新机制-通过类似Tamm的界面态复合。在周期性的ZnSe / BeTe异质结构的光致发光光谱中,在能量处观察到亮线,这对应于研究的异质系统中电子与空穴Tamm状界面态之间的光学跃迁。在15K至160K的温度范围内,通过Tamm样界面态观察到了宽范围激发密度的光致发光。发现对于低温和低激发密度下的短周期ZnSe / BeTe异质结构,通过Tamm样界面态的光致发光比常规的带间辐射复合强得多。

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