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Investigation of maple-deposited DNA films for graphene-based device applications

机译:用于基于石墨烯的器件应用中的枫树沉积DNA膜的研究

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摘要

In this study, we investigate a new technique to fabricate DNA-CTMA films with tunable properties. MAPLE is, for the first time, explored to deposit DNA-CTMA dielectric films on top of epitaxially grown graphene on silicon carbide (SiC) substrate. Silicon dioxide (SiO_2) is commonly used as a gate insulator in graphene based field effect transistors (GFETs) in a top gate configuration. The high temperature deposition of SiO_2 on graphene is known to cause damage to the surface of the graphene leading to poor device operation. We propose an alternative gate insulator based on a bio-organic (DNA-CTMA) material processed and deposited at room temperature (RT) using MAPLE. Hall measurements run before and after DNA-CTMA deposition showed no change in the type of conductivity as well as charge carrier mobility.
机译:在这项研究中,我们研究了一种新技术,以制造具有可调特性的DNA-CTMA膜。 MAPLE首次探索将DNA-CTMA电介质膜沉积在碳化硅(SiC)衬底上外延生长的石墨烯的顶部。二氧化硅(SiO_2)通常用作顶栅配置中基于石墨烯的场效应晶体管(GFET)中的栅绝缘体。众所周知,SiO_2在石墨烯上的高温沉积会损坏石墨烯的表面,从而导致不良的器件操作。我们提出了一种替代的栅极绝缘体,该绝缘体基于使用MAPLE在室温(RT)处理和沉积的生物有机(DNA-CTMA)材料。在DNA-CTMA沉积之前和之后进行的霍尔测量表明,电导类型以及电荷载流子迁移率没有变化。

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  • 来源
  • 会议地点 San Diego CA(US)
  • 作者单位

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433;

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433;

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433,University of Dayton Research Institute, Dayton OH 45469;

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433,Universal Technology Corporation, Beavercreek OH 45432;

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433,University of Dayton Research Institute, Dayton OH 45469;

    Air Force Research Laboratory, Wright-Patterson AFB, OH 45433;

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  • 正文语种 eng
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  • 入库时间 2022-08-26 13:44:26

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