Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8212, Gaithersburg, MD, USA 20899-8212;
Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8212, Gaithersburg, MD, USA 20899-8212;
Statistical Engineering Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8212, Gaithersburg, MD, USA 20899-8212;
Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8212, Gaithersburg, MD, USA 20899-8212;
Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology, 100 Bureau Drive MS 8212, Gaithersburg, MD, USA 20899-8212;
hybrid metrology; electromagnetic simulation; sensitivity and uncertainty evaluation;
机译:通过对系统误差建模,改进了极端紫外散射法中关键尺寸的重建
机译:具有非识别相干反射的小物体光学测量中的系统误差
机译:一维扫描激光振动计在兰姆波观测中的系统测量误差的识别与避免
机译:系统误差对光学关键尺寸测量杂交的影响
机译:最小化源自卫星海洋颜色测量的浮游植物色素浓度的系统误差
机译:使用三维MRI数字重建X射线照片评估婴儿髋部X射线照片的测量误差
机译:用于100nm临界尺寸测量的新型近场光学探头
机译:用于100nm临界尺寸测量的新型近场光学探头