The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation

机译：电子背向散射衍射和聚焦离子束显微镜的结合确定三维晶粒取向

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《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|1794-1795|共2页
会议地点 Phoenix, AZ(US)
作者
William M. Kane;
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Exponent Failure Analysis Associates 3401 Market Street Philadelphia PA 19104;

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1. The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation [J] . William M. Kane Journal of Failure Analysis and Prevention . 2013,第3期

机译：电子背向散射衍射和聚焦离子束显微镜相结合确定三维晶粒取向
2. Three-Dimensional Morphological and Crystallographic Investigation of Lamellar Alpha and Retained Beta in a Near Alpha Titanium Alloy by Combination of Focused Ion Beam and Electron Backscattering Diffraction [J] . Dong He, Stefan Zaefferer, Jingchuan Zhu Steel Research International . 2012,第5期

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3. Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments [J] . Eli Stavitski, Martyn R. Drury, D. A. Matthijs de Winter Angewandte Chemie . 2008,第30期

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4. Grain Boundary Corrosion of UNS N10276 using Orientation Imaging via Electron Backscatter Diffraction Microscopy (EBSD) [C] . Christopher M. Hefferan, Michael J. Deible, Matthew J Perricone, NACE international corrosion conference and expo . 2019

机译：通过电子背散射衍射显微镜（EBSD）定向成像，对UNS N10276的晶界腐蚀
5. Characterization of Dislocation–Grain Boundary Interactions Through Electron Backscatter Diffraction [D] . Hansen, Landon Thomas. 2019

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6. Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction [O] . Dominik Kriegner, Petr Harcuba, Jozef Veselý, -1

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7. Intergrowth Structure of Zeolite Crystals and Pore Orientation of Individual Subunits Revealed by Electron Backscatter Diffraction/Focused Ion Beam Experiments [O] . Eli Stavitski, Martyn R. Drury, D. A. Matthijs de Winter, 2008

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The Combination of Electron Backscatter Diffraction and Focus Ion Beam Microscopy to Determine Three-Dimensional Grain Orientation

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