Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

机译：使用Hitachi SU8000 FE-SEM比较电子通道对比度成像（ECCI）和电子背向散射衍射（EBSD）

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来源
《Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting》|2012年|700-701|共2页
会议地点 Phoenix, AZ(US)
作者
S. Kaboli; J. Su; R. Gauvin;
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Department of Mining and Materials Engineering McGill University Montreal QC H3A 2B2;

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入库时间 2022-08-26 14:38:37

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Comparison of Electron Channeling Contrast Imaging (ECCI) and Electron Back Scattered Diffraction (EBSD) using Hitachi SU8000 FE-SEM

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