Electrically active grain boundaries in GaP

摘要

SEM REBIC was used to study electrically active grain boundaries in polycrystalline GaP.The electrically active boundaries were found to run parallel,independently of the direction from one contact to the other.The REBIC signal profiles were suppressed at low scan speeds due,it is thought,to the resistance and capacitance of the specimens themselves acting as high-pass filters.Boundary contrast due to high resistivity boundary layers,to trapped charge or to enhanced or reduced recombination was found.